Atomic force microscopy as a tool for asymmetric polymeric membrane characterization

Abdul Wahab Mohammad, and Nidal Hilal, and Lim, Ying Pei and Indok Nurul Hasyimah Mohd Amin, and Rafeqah Raslan, (2011) Atomic force microscopy as a tool for asymmetric polymeric membrane characterization. Sains Malaysiana, 40 (3). pp. 237-244. ISSN 0126-6039


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Atomic force microscopy (AFM) has a wide range of applications and is rapidly growing in research and development. This powerful technique has been used to visualize surfaces both in liquid or gas media. It has been considered as an effective tool to investigate the surface structure for its ability to generate high-resolution 3D images at a subnanometer range without sample pretreatment. In this paper, the use of AFM to characterize the membrane roughness is presented for commercial and self-prepared membranes for specific applications. Surface roughness has been regarded as one of the most important surface properties, and has significant effect in membrane permeability and fouling behaviour. Several scan areas were used to compare surface roughness for different membrane samples. Characterization of the surfaces was achieved by measuring the average roughness (Ra) and root mean square roughness (Rrms) of the membrane. AFM image shows that the membrane surface was composed entirely of peaks and valleys. Surface roughness is substantially greater for commercial available hydrophobic membranes, in contrast to self-prepared membranes. This study also shows that foulants deposited on membrane surface would increase the membrane roughness.

Item Type:Article
Keywords:Atomic Force Microscopy (AFM); fouling; hydrophobic; membrane roughness
Journal:Sains Malaysiana
ID Code:704
Deposited By: Mr Azam
Deposited On:23 Mar 2011 03:23
Last Modified:14 Dec 2016 06:27

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