Number of items: 1.
Sabar D. Hutagalung, and Kam, Chung Lew and Darsono, Teguh
(2014)
Nanoscale patterning by AFM lithography and its application
on the fabrication of silicon nanowire devices.
Sains Malaysiana, 43
(2).
pp. 267-272.
ISSN 0126-6039
This list was generated on Sat Dec 28 01:12:56 2024 MYT.